DocumentCode :
27167
Title :
Learning Weighted Lower Linear Envelope Potentials in Binary Markov Random Fields
Author :
Gould, Stephen
Author_Institution :
Res. Sch. of Comput. Sci., Australian Nat. Univ., Canberra, ACT, Australia
Volume :
37
Issue :
7
fYear :
2015
fDate :
July 1 2015
Firstpage :
1336
Lastpage :
1346
Abstract :
Markov random fields containing higher-order terms are becoming increasingly popular due to their ability to capture complicated relationships as soft constraints involving many output random variables. In computer vision an important class of constraints encode a preference for label consistency over large sets of pixels and can be modeled using higher-order terms known as lower linear envelope potentials. In this paper we develop an algorithm for learning the parameters of binary Markov random fields with weighted lower linear envelope potentials. We first show how to perform exact energy minimization on these models in time polynomial in the number of variables and number of linear envelope functions. Then, with tractable inference in hand, we show how the parameters of the lower linear envelope potentials can be estimated from labeled training data within a max-margin learning framework. We explore three variants of the lower linear envelope parameterization and demonstrate results on both synthetic and real-world problems.
Keywords :
Markov processes; higher order statistics; inference mechanisms; learning (artificial intelligence); random processes; binary Markov random fields; computer vision; energy minimization; label consistency; linear envelope functions; linear envelope parameterization; lower linear envelope potentials; max-margin learning framework; soft constraints; time polynomial; tractable inference; weighted lower linear envelope potential learning; Computational modeling; IEEE Potentials; Image segmentation; Inference algorithms; Minimization; Polynomials; Higher-order MRFs; higher-order MRFs; lower linear envelope potentials; max-margin learning;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2014.2366760
Filename :
6945904
Link To Document :
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