• DocumentCode
    27167
  • Title

    Learning Weighted Lower Linear Envelope Potentials in Binary Markov Random Fields

  • Author

    Gould, Stephen

  • Author_Institution
    Res. Sch. of Comput. Sci., Australian Nat. Univ., Canberra, ACT, Australia
  • Volume
    37
  • Issue
    7
  • fYear
    2015
  • fDate
    July 1 2015
  • Firstpage
    1336
  • Lastpage
    1346
  • Abstract
    Markov random fields containing higher-order terms are becoming increasingly popular due to their ability to capture complicated relationships as soft constraints involving many output random variables. In computer vision an important class of constraints encode a preference for label consistency over large sets of pixels and can be modeled using higher-order terms known as lower linear envelope potentials. In this paper we develop an algorithm for learning the parameters of binary Markov random fields with weighted lower linear envelope potentials. We first show how to perform exact energy minimization on these models in time polynomial in the number of variables and number of linear envelope functions. Then, with tractable inference in hand, we show how the parameters of the lower linear envelope potentials can be estimated from labeled training data within a max-margin learning framework. We explore three variants of the lower linear envelope parameterization and demonstrate results on both synthetic and real-world problems.
  • Keywords
    Markov processes; higher order statistics; inference mechanisms; learning (artificial intelligence); random processes; binary Markov random fields; computer vision; energy minimization; label consistency; linear envelope functions; linear envelope parameterization; lower linear envelope potentials; max-margin learning framework; soft constraints; time polynomial; tractable inference; weighted lower linear envelope potential learning; Computational modeling; IEEE Potentials; Image segmentation; Inference algorithms; Minimization; Polynomials; Higher-order MRFs; higher-order MRFs; lower linear envelope potentials; max-margin learning;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2014.2366760
  • Filename
    6945904