• DocumentCode
    2716739
  • Title

    Multi-label ReliefF and F-statistic feature selections for image annotation

  • Author

    Kong, Deguang ; Ding, Chris ; Huang, Heng ; Zhao, Haifeng

  • Author_Institution
    Dept. of CSE, Univ. of Texas at Arlington, Arlington, TX, USA
  • fYear
    2012
  • fDate
    16-21 June 2012
  • Firstpage
    2352
  • Lastpage
    2359
  • Abstract
    The classical ReliefF and F-statistic feature selections can not be directly applied into multi-label problems due to the ambiguity produced from a data point attributed to multiple classes simultaneously. In this paper, we present MReliefF and MF-statistic algorithms for multi-label feature selections. Discriminant features are selected to boost the multi-label classification accuracy. The proposed MReliefF and MF-statistic can be used in image categorization and annotation problems. Extensive experiments on image annotation tasks show the good performance of our approach. To our knowledge, this is the first work to generalize the ReliefF and F-statistic feature selection algorithms for multi-label image annotation tasks.
  • Keywords
    feature extraction; image classification; statistical analysis; F-statistic feature selections; MF-statistic algorithms; MReliefF; discriminant features; image annotation; image categorization; multilabel ReliefF; multilabel classification accuracy; multilabel feature selections; Buildings; Educational institutions; Feature extraction; Image color analysis; Semantics; Standards; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on
  • Conference_Location
    Providence, RI
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4673-1226-4
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2012.6247947
  • Filename
    6247947