DocumentCode
2716759
Title
Batch mode Adaptive Multiple Instance Learning for computer vision tasks
Author
Li, Wen ; Duan, Lixin ; Tsang, Ivor Wai-Hung ; Xu, Dong
Author_Institution
Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear
2012
fDate
16-21 June 2012
Firstpage
2368
Lastpage
2375
Abstract
Multiple Instance Learning (MIL) has been widely exploited in many computer vision tasks, such as image retrieval, object tracking and so on. To handle ambiguity of instance labels in positive bags, the training process of traditional MIL methods is usually computationally expensive, which limits the applications of MIL in more computer vision tasks. In this paper, we propose a novel batch mode framework, namely Batch mode Adaptive Multiple Instance Learning (BAMIL), to accelerate the instance-level MIL methods. Specifically, instead of using all training bags at once, we divide the training bags into several sets of bags (i.e., batches). At each time, we use one batch of training bags to train a new classifier which is adapted from the latest pre-learned classifier. Such batch mode framework significantly accelerates the traditional MIL methods for large scale applications and can be also used in dynamic environments such as object tracking. The experimental results show that our BAMIL is much faster than the recently developed MIL with constrained positive bags while achieves comparable performance for text-based web image retrieval. In dynamic settings, BAMIL also achieves the better overall performance for object tracking when compared with other online MIL methods.
Keywords
Internet; computer vision; image classification; image retrieval; learning (artificial intelligence); object tracking; text analysis; BAMIL; batch mode adaptive multiple instance learning; computer vision tasks; constrained positive bags; instance-level MIL method acceleration; object tracking; online MIL methods; prelearned classifier; text-based Web image retrieval; training bags; Acceleration; Bismuth; Image retrieval; Kernel; Silicon; Training; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on
Conference_Location
Providence, RI
ISSN
1063-6919
Print_ISBN
978-1-4673-1226-4
Electronic_ISBN
1063-6919
Type
conf
DOI
10.1109/CVPR.2012.6247949
Filename
6247949
Link To Document