Title :
On-Wafer Vector Network Analyzer Measurements in the 220-325 GHz Frequency Band
Author :
Fung, A.K. ; Dawson, D. ; Samoska, L. ; Lee, K. ; Oleson, C. ; Boll, G.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
Abstract :
We report on a full two-port on-wafer vector network analyzer test set for the 220-325 GHz (WR3) frequency band. The test set utilizes Oleson Microwave Labs frequency extenders with the Agilent 8510C network analyzer. Two port on-wafer measurements are made with GGB Industries coplanar waveguide (CPW) probes. With this test set we have measured the WR3 band S-parameters of amplifiers on-wafer, and the characteristics of the CPW wafer probes. Results for a three stage InP HEMT amplifier show 10 dB gain at 235 GHz as presented in D. Dawson et al. (2005), and that of a single stage amplifier, 2.9 dB gain at 231 GHz. The approximate upper limit of loss per CPW probe range from 3.0 to 4.8 dB across the WR3 frequency band
Keywords :
HEMT integrated circuits; III-V semiconductors; MMIC amplifiers; S-parameters; coplanar waveguides; indium compounds; millimetre wave measurement; network analysers; probes; submillimetre wave measurement; two-port networks; 10 dB; 2.9 dB; 220 to 325 GHz; 3 to 4.8 dB; HEMT amplifier; InP; S-parameters measurement; WR3 frequency band; coplanar waveguide probes; frequency extenders; on-wafer measurements; single stage amplifier; vector network analyzer; wafer probes; Coplanar waveguides; Extraterrestrial measurements; Frequency measurement; Gain; HEMTs; Indium phosphide; MMICs; Probes; Scattering parameters; Testing; Coplanar Transmission Lines; Coplanar Waveguides; MMIC Amplifiers; Measurement;
Conference_Titel :
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-9541-7
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2006.249811
