DocumentCode :
2717531
Title :
The thru-reflection-unequal-line (TRuL) calibration method with asymmetric R calibrator for multi-port scattering matrix measurement
Author :
Lu, Hsin-Chia ; Chou, Yien-Tien
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
fYear :
2006
fDate :
11-16 June 2006
Firstpage :
1971
Lastpage :
1974
Abstract :
The multimode TRL calibration method is known as an approach for the measurement of multi-conductor transmission line devices. The propagation constants of different modes propagating along the multi-conductor transmission line must be different when using this method. However, in general multi-port networks, the propagating constants at each port may be equal. We here then present the thru-reflection-unequal-line (TRuL) calibration method for the calibration of the equal propagation constant case. Lines of unequal length are used to make the eigenvalues unequal during calibration process. This will greatly simplify the calculation. Asymmetric "R" calibrator is proposed to simplify the sign ambiguity resolution process. The measured scattering matrix of a branch line coupler on FR4 substrate using proposed calibration method shows good agreement with simulation
Keywords :
S-parameters; calibration; eigenvalues and eigenfunctions; multiconductor transmission lines; transmission line matrix methods; FR4 substrate; asymmetric R calibrator; branch line coupler; multiconductor transmission line devices; multimode TRL calibration; multiport networks; multiport scattering matrix measurement; propagation constants; sign ambiguity resolution; thru-reflection-unequal-line calibration; Calibration; Eigenvalues and eigenfunctions; Electric variables measurement; Linear matrix inequalities; Multiconductor transmission lines; Propagation constant; Reflection; Scattering parameters; Transmission line matrix methods; Transmission line measurements; calibration; multiport network; scattering parameters measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location :
San Francisco, CA
ISSN :
0149-645X
Print_ISBN :
0-7803-9541-7
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2006.249821
Filename :
4015346
Link To Document :
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