Title :
Learning sparse covariance patterns for natural scenes
Author :
Wang, Liwei ; Li, Yin ; Jia, Jiaya ; Sun, Jian ; Wipf, David ; Rehg, James M.
Author_Institution :
Chinese Univ. of Hong Kong, Hong Kong, China
Abstract :
For scene classification, patch-level linear features do not always work as well as handcrafted features. In this paper, we present a new model to greatly improve the usefulness of linear features in classification by introducing co-variance patterns. We analyze their properties, discuss the fundamental importance, and present a generative model to properly utilize them. With this set of covariance information, in our framework, even the most naive linear features that originally lack the vital ability in classification become powerful. Experiments show that the performance of our new covariance model based on linear features is comparable with or even better than handcrafted features in scene classification.
Keywords :
feature extraction; image classification; learning (artificial intelligence); covariance information; handcrafted features; naive linear features; natural scenes; patch-level linear features; scene classification; sparse covariance patterns learning; Computational modeling; Correlation; Covariance matrix; Dictionaries; Encoding; Vectors; Visualization;
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on
Conference_Location :
Providence, RI
Print_ISBN :
978-1-4673-1226-4
Electronic_ISBN :
1063-6919
DOI :
10.1109/CVPR.2012.6248000