DocumentCode :
271777
Title :
A sequential Bayesian based method for tracking and strain palpography estimation of arteries in intravascular ultrasound images
Author :
Widynski, Nicolas ; Porée, Jonathan ; Cardinal, Marie-Helene Roy ; Ohayon, Jacques ; Cloutier, Guy ; Garcia, D.
Author_Institution :
RUBIC, Univ. of Montreal Hosp. Res. Center, Montreal, QC, Canada
fYear :
2014
fDate :
3-6 Sept. 2014
Firstpage :
515
Lastpage :
518
Abstract :
This paper investigates the task of tracking and strain estimation of arteries in intravascular ultrasound images. A tracking method is proposed to extract the inner and the outer contours of the vessel wall (lumen/intima-media and intima-media/adventitia interfaces, respectively), and the deformations along them. This estimation is carried out by a non parametric sequential Bayesian method. The Bayesian modeling holds three ingredients: the prior, which is given by a manually defined segmentation of the contours on the first image; the transition, which is assumed to follow a Markovian random walk; and the likelihood, which is a distance between patches distributed along the contours. The underlying Bayesian posterior distribution is approximated using a sequential Monte Carlo approach. Experiments on three PVA-C phantoms present direct readings of the deformations along the lumen/intima-media contour.
Keywords :
Bayes methods; Markov processes; Monte Carlo methods; biomechanics; biomedical ultrasonics; blood vessels; image segmentation; medical image processing; phantoms; Bayesian posterior distribution; Markovian random walk; Monte Carlo approach; PVA-C phantoms; arteries strain estimation; arteries tracking estimation; image segmentation; intima-media contour; intravascular ultrasound images; lumen contour; nonparametric sequential Bayesian method; palpography estimation; sequential Bayesian based method; vessel wall; Arteries; Catheters; Elasticity; Estimation; Strain; Stress; Ultrasonic imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium (IUS), 2014 IEEE International
Conference_Location :
Chicago, IL
Type :
conf
DOI :
10.1109/ULTSYM.2014.0127
Filename :
6932313
Link To Document :
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