Title :
DC-RF Performance Improvement for Strained 0.13 μm MOSFETs mounted on a Flexible Plastic Substrate
Author :
Kao, H.L. ; Chin, Albert ; Liao, C.C. ; Tseng, Y.Y. ; McAlister, S.P. ; Chi, C.C.
Author_Institution :
Dept. of Electron. Eng., National Chiao-Tung Univ., Hsinchu
Abstract :
By applying 0.7% tensile strain to the flexible die of a 0.13 mum thin-body (40 mum) Si MOSFET mounted on plastic, both the DC and RF performance have been improved. The current Id,sat was 14.3% higher, and fT increased from 103 to 118 GHz with NF min decreasing from 0.89 to 0.75 dB at 10 GHz. These improvements are comparable with those for SiN-capped 90 nm strained-Si nMOS and consistent with device simulations. The approach has the advantages of better RF passive devices on the insulating plastic substrate and low cost
Keywords :
MOSFET; semiconductor device packaging; stress effects; surface mount technology; 0.13 micron; DC-RF performance improvement; RF noise; RF passive devices; flexible plastic substrate; insulating plastic substrate; strained MOSFET; Capacitive sensors; Costs; MOS devices; MOSFETs; Microstrip; Noise figure; Noise measurement; Plastic insulation; Radio frequency; Tensile strain; MOSFET; RF Noise; associated gain; plastic;
Conference_Titel :
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-9541-7
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2006.249856