DocumentCode
2718026
Title
Improvised nuclear device case study: An analytic framework for disaster management
Author
Buddemeier, Brooke ; Suski, Nancy
Author_Institution
Lawrence Livermore Nat. Lab., Livermore, CA, USA
fYear
2011
fDate
15-17 Nov. 2011
Firstpage
190
Lastpage
195
Abstract
Reducing the casualties of catastrophic terrorist attacks requires an understanding of weapons of mass destruction effects, infrastructure damage, atmospheric dispersion, and health effects. The Federal Planning Guidance for Response to a Nuclear Detonation provides the strategy for response to an improvised nuclear device detonation. The supporting science developed by national laboratories and other technical organizations for this document significantly improves our understanding of the hazards posed by such an event. Detailed fallout predictions from the advanced suite of three-dimensional meteorology and plume/fallout models developed at Lawrence Livermore National Laboratory, including extensive global geographical and realtime meteorological databases to support model calculations, are a key part of response planning. This presentation describes the methodology and results to date, including visualization aids developed for response organizations. These products have greatly enhanced the community planning process through first-person points of view and description of the dynamic nature of the event.
Keywords
hazards; meteorology; national security; natural radioactivity hazards; radioactive pollution; terrorism; weapons; atmospheric dispersion; health effect; infrastructure damage; mass destruction effect; meteorology; nuclear device case study; nuclear device detonation; plume-fallout model; radiological hazard; real-time meteorological database; weapons; Buildings; Communities; Explosions; Fires; Laboratories; Planning; Terrorism; blast analysis; disaster management; emergency response; improvised nuclear device; radiological hazard;
fLanguage
English
Publisher
ieee
Conference_Titel
Technologies for Homeland Security (HST), 2011 IEEE International Conference on
Conference_Location
Waltham, MA
Print_ISBN
978-1-4577-1375-0
Type
conf
DOI
10.1109/THS.2011.6107869
Filename
6107869
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