Title :
Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing
Abstract :
The following topics were dealt with: simulation in memory design; testing random access memories; bridging faults and IDDQ testing; memory built-in self test; application specific memory designs; advance memory architectures; and new topics in memory testing.
Keywords :
built-in self test; integrated memory circuits; memory architecture; I/sub DDQ/ testing; advance memory architectures; application specific memory designs; bridging faults; memory built-in self test; memory design; memory testing; random access memories; testing;
Conference_Titel :
Memory Technology, Design and Testing, 1995., Records of the 1995 IEEE International Workshop on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-7102-5
DOI :
10.1109/MTDT.1995.518073
