• DocumentCode
    2718626
  • Title

    Author index

  • fYear
    1995
  • fDate
    7-8 Aug. 1995
  • Firstpage
    129
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design and Testing, 1995., Records of the 1995 IEEE International Workshop on
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    0-8186-7102-5
  • Type

    conf

  • DOI
    10.1109/MTDT.1995.518094
  • Filename
    518094
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2718626