• DocumentCode
    2718719
  • Title

    Large area SrTiO3 thin films for active microwave applications grown by pulsed laser deposition

  • Author

    Knauss, L.A. ; Horwitz, J.S. ; Pond, J.M. ; Knies, D.L. ; Grabowski, K.S. ; Chrisey, D.B. ; Mueller, C.H.

  • Author_Institution
    Naval Res. Lab., Washington, DC, USA
  • Volume
    2
  • fYear
    1996
  • fDate
    18-21 Aug 1996
  • Firstpage
    829
  • Abstract
    Thin films of SrTiO3 have been grown by pulsed laser deposition (PLD) on 2" diameter LaAlO3 substrates using a technique in which the laser beam is rastered over the radius of a 4 inch diameter target while the substrate is rotated in a radiative blackbody heater. The deposition occurs through a pie shaped opening in the heater. The structure, composition and thickness have been measured using XRD and RBS. The dielectric properties of the film have been measured at 1 MHz utilizing an LCR meter. The results indicate that the films are single phase and (001) oriented. However, film composition, thickness and dielectric properties are not uniform along the radius of the film. The results indicate that the composition nonuniformity is due to off-axis deposition, and correlates with changes in the dielectric properties
  • Keywords
    Rutherford backscattering; X-ray diffraction; capacitance; ferroelectric thin films; pulsed laser deposition; strontium compounds; (001) orientation; 1 MHz; 2 inch; 4 inch; LCR meter; LaAlO3; LaAlO3 substrates; RBS; SrTiO3; XRD; active microwave applications; capacitance; composition nonuniformity; dielectric properties; large area SrTiO3 thin films; laser beam rastering; off-axis deposition; pie shaped opening; pulsed laser deposition; radiative blackbody heater; single phase films; structure; substrate rotation; thickness; Dielectric measurements; Electrodes; Fingers; Masers; Optical films; Optical pulses; Pulsed laser deposition; Sputtering; Substrates; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 1996. ISAF '96., Proceedings of the Tenth IEEE International Symposium on
  • Conference_Location
    East Brunswick, NJ
  • Print_ISBN
    0-7803-3355-1
  • Type

    conf

  • DOI
    10.1109/ISAF.1996.598152
  • Filename
    598152