• DocumentCode
    271894
  • Title

    The EDA challenges in the dark silicon era

  • Author

    Shafique, Muhammad ; Garg, Shelly ; Henkel, Jörg ; Marculescu, Diana

  • Author_Institution
    Dept. of Embedded Syst., Karlsruhe Inst. of Technol., Karlsruhe, Germany
  • fYear
    2014
  • fDate
    1-5 June 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Technology scaling has resulted in smaller and faster transistors in successive technology generations. However, transistor power consumption no longer scales commensurately with integration density and, consequently, it is projected that in future technology nodes it will only be possible to simultaneously power on a fraction of cores on a multi-core chip in order to stay within the power budget. The part of the chip that is powered off is referred to as dark silicon and brings new challenges as well as opportunities for the design community, particularly in the context of the interaction of dark silicon with thermal, reliability and variability concerns. In this perspectives paper we describe these new challenges and opportunities, and provide preliminary experimental evidence in their support.
  • Keywords
    electronic design automation; integrated circuit design; power consumption; semiconductor device reliability; thermal management (packaging); transistors; EDA; dark silicon era; integration density; multicore chip; technology scaling; transistor power consumption; Integrated circuit reliability; Multicore processing; Program processors; Silicon; Threshold voltage; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1145/2593069.2593229
  • Filename
    6881512