Title :
Statistical parametric mapping of FMRI data using sparse dictionary learning
Author :
Lee, Kangjoo ; Ye, Jong Chul
Author_Institution :
Dept. Bio & Brain Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
Abstract :
Statistical parametric mapping (SPM) of functional magnetic resonance imaging (fMRI) uses a canonical hemodynamic response function (HRF) to construct the design matrix within the general linear model (GLM) framework. Recently, there has been many research on data-driven method on fMRI data, such as the independence component analysis (ICA). The main weakness of ICA for fMRI is its restrictive assumption, especially independence. Furthermore, recent study demonstrated that sparsity is more important than independency in ICA analysis for fMRI. Hence, we propose sparse learning algorithm, such as K-SVD, as an alternative, that decomposes the dictionary-atoms using sparsity rather than independence of the components. For the fMRI finger tapping task data, we employed the K-SVD algorithm to extract the time-course signal atoms of brain activation. The activation maps using trained dictionary as a design matrix showed tightly localized signals in a small set of brain areas.
Keywords :
biomedical MRI; brain; feature extraction; haemodynamics; independent component analysis; learning (artificial intelligence); neurophysiology; sparse matrices; statistical analysis; support vector machines; K-SVD algorithm; brain activation; canonical hemodynamic response function; data-driven method; fMRI finger tapping task data; feature extraction; functional magnetic resonance imaging; general linear model framework; independence component analysis; sparse dictionary learning; statistical parametric mapping; time-course signal atoms; Data mining; Dictionaries; Fingers; Hemodynamics; Independent component analysis; Magnetic analysis; Magnetic resonance imaging; Scanning probe microscopy; Signal design; Sparse matrices; GLM model; K-SVD; Sparse learning; dictionary; fMRI;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2010 IEEE International Symposium on
Conference_Location :
Rotterdam
Print_ISBN :
978-1-4244-4125-9
Electronic_ISBN :
1945-7928
DOI :
10.1109/ISBI.2010.5490090