Title :
Non-destructive inspection of opaque objects with a 3D millimeter-wave tomographic scanner
Author :
Younus, A. ; Salort, S. ; Caumes, J.-P. ; Desbarats, P. ; Mounaix, P. ; Abraham, E.
Author_Institution :
CPMOH, Univ. de Bordeaux, Talence, France
Abstract :
Flexible monochromatic millimeter wave system coupled with an infrared temperature sensor demonstrates large size 3D visualization of manufactured opaque phantoms with different refractive index contrasts. Peculiarities such as boundary effects, refraction and diffraction losses will be discussed.
Keywords :
diffraction; image reconstruction; millimetre wave imaging; nondestructive testing; refraction; refractive index; temperature sensors; 3D millimeter-wave tomographic scanner; 3D visualization; boundary effects; diffraction losses; flexible monochromatic millimeter wave system; infrared temperature sensor; nondestructive inspection; opaque objects; refraction; refractive index contrasts; Image reconstruction; Optimized production technology; Refractive index; Three dimensional displays; Tomography; Visualization;
Conference_Titel :
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-6655-9
DOI :
10.1109/ICIMW.2010.5612989
