Virtual instruments for development of high performance circuit technologies

A set of virtual instruments based on computer-aided design tools for technology (TCAD) are described. These virtual instruments support the evaluation of new technologies for circuit applications, including both intrinsic and parasitic effects. Mixed-mode (circuit/device) simulation in both the frequency and time-domain is demonstrated including an example of a virtual network analyzer applied to evaluation of a GaAs FET. Virtual curve-tracing is demonstrated as a powerful means to obtain I-V curves and to zoom in on the regions of device characteristics where SPICE model parameters can effectively be extracted and parasitic effects such as failure mechanisms due to electrostatic discharge (ESD) can be analyzed. Finally large signal distortion behavior analyzed based on the device simulation using the harmonic balance (HB) method is demonstrated with application to extraction of intermodulation (IM) distortion in bipolar transistor circuits