Title :
Efficient worst case analysis of integrated circuits
Author :
Lokanathan, A.N. ; Brockman, Jay B.
Author_Institution :
Dept. of Comput. Sci. & Eng., Notre Dame Univ., IN, USA
Abstract :
A simple, accurate and inexpensive approach to worst case analysis of integrated circuits is presented. The approach may be applied to either known process statistics or a database of candidate simulation points
Keywords :
circuit CAD; circuit analysis computing; digital simulation; integrated circuit design; monolithic integrated circuits; semiconductor process modelling; IC design; candidate simulation point database; circuit CAD; known process statistics; semiconductor integrated circuits; worst case analysis; Analytical models; Circuit analysis; Circuit optimization; Circuit simulation; Computer aided software engineering; Computer science; Costs; Databases; Fabrication; Performance analysis;
Conference_Titel :
Custom Integrated Circuits Conference, 1995., Proceedings of the IEEE 1995
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-2584-2
DOI :
10.1109/CICC.1995.518176
