DocumentCode
272007
Title
Design and test of a low-power 90nm XOR/XNOR gate for cryptographic applications
Author
Tena-SaÌnchez, Erica ; Castro, Jose ; Acosta, Antonio J.
Author_Institution
Inst. de Microelectron. de Sevilla, Univ. de Sevilla, Sevilla, Spain
fYear
2014
fDate
Sept. 29 2014-Oct. 1 2014
Firstpage
1
Lastpage
8
Abstract
In this paper, the design of a XOR/XNOR gate for low-power cryptographic applications is presented. The proposed gate optimizes the SABL (Sense Amplifier Based Logic) gate, widely used in cryptocircuit implementations, by removing residual charge in the pull-down circuit and simplifying the pull-up. The resulting gate improves SABL in terms of area, power consumption, propagation delay and resilience against Differential Power Analysis (DPA) attacks. To demonstrate the gain in performances, both gates have been designed, physically implemented and experimentally characterized, in a 90nm TSMC technology. Experimental results show a reduction of 15% in area, 12% in power consumption, and 40% in delay in the proposed gate. To demonstrate the gain in security of the proposal, simulation-based DPA attacks have been performed on respective Kasumi Sbox9 implementations, being our proposal suitable for inmediate application in high-performance secure cryptographic applications.
Keywords
cryptography; logic gates; low-power electronics; power consumption; Kasumi Sbox9 implementations; TSMC technology; differential power analysis attacks; low-power XOR/XNOR gate; low-power cryptographic applications; power consumption; propagation delay; pull-down circuit; pull-up circuit; sense amplifier based logic gate; size 90 nm; Gain; Logic gates; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Power and Timing Modeling, Optimization and Simulation (PATMOS), 2014 24th International Workshop on
Conference_Location
Palma de Mallorca
Type
conf
DOI
10.1109/PATMOS.2014.6951909
Filename
6951909
Link To Document