• DocumentCode
    2720120
  • Title

    Locally weighted Markov random fields for cortical segmentation

  • Author

    Cardoso, Manuel Jorge ; Clarkson, Matthew J. ; Modat, Marc ; Ridgway, Gerard R. ; Ourselin, Sebastien

  • Author_Institution
    Centre for Med. Image Comput., Univ. Coll. London, London, UK
  • fYear
    2010
  • fDate
    14-17 April 2010
  • Firstpage
    956
  • Lastpage
    959
  • Abstract
    Segmenting the human brain from magnetic resonance images is a challenging task due to the convoluted shape of the cortex, noise, intensity non-uniformity and partial volume effects. We propose a new way to overcome part of the bias-variance tradeoff existent in any segmentation technique by locally varying the behaviour of the model. We developed a novel metric based on the Laplacian of the geodesic distance to localise and iteratively modify the prior information and Markov random field weights, leading to a better delineation of deep sulci and narrow gyri. Experiments performed on 20 Brainweb datasets show statistically significant improvements in Dice scores and partial volume estimation when compared to two well established techniques.
  • Keywords
    Markov processes; biomedical MRI; brain; image segmentation; iterative methods; medical image processing; Brainweb datasets; Dice scores; Laplacian method; bias-variance tradeoff existent; convoluted shape; cortical segmentation; deep sulci delineation; geodesic distance; human brain; intensity nonuniformity; iterative modification; locally weighted Markov random fields; magnetic resonance images; narrow gyri; partial volume effects; partial volume estimation; Biomedical imaging; Brain modeling; Cost function; Educational institutions; Image segmentation; Magnetic noise; Magnetic resonance; Markov random fields; Noise robustness; Noise shaping; Expectation-Maximisation; Markov random field; cortical segmentation; partial volume effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2010 IEEE International Symposium on
  • Conference_Location
    Rotterdam
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4125-9
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2010.5490146
  • Filename
    5490146