Title :
A comparison of RS/1 and SPAYN for the generation of worst-case SPICE level 3 MOSFET model parameters
Author :
Clancy, R. ; Welten, M. ; Power, J.A. ; Mason, B. ; Stribley, P. ; Mathewson, A.
Author_Institution :
Silvaco Int., Santa Clara, CA, USA
Abstract :
This paper compares RS/1 RPL routines developed at the NMRC which use principal component analysis and VARIMAX techniques to extract SPICE level 3 MOSFET nominal and worst-case model parameters, and the Silvaco international product SPAYN (Statistical Parameter and Yield analysis), a statistical analysis software program specifically designed for the microelectronics industry
Keywords :
MOSFET; SPICE; semiconductor device models; RS/1 RPL routines; Silvaco international product SPAYN; VARIMAX techniques; component analysis; microelectronics industry; statistical analysis software program; worst-case SPICE level 3 MOSFET model parameters;
Conference_Titel :
Improving the Efficiency of IC Manufacturing Technology, IEE Colloquium on
Conference_Location :
London
DOI :
10.1049/ic:19950929
