Title :
Measurement of the complex refractive index of liquids in the terahertz range using ellipsometry
Author :
Dobroiu, Adrian ; Otani, Chiko
Author_Institution :
RIKEN, Sendai, Japan
Abstract :
We used ellipsometry to determine the complex index of refraction of liquids in the terahertz range. The method works by allowing a polarized terahertz wave to reflect on the interface between high-resistivity silicon and the liquid sample, and analyzing the polarization state of the reflected wave.
Keywords :
ellipsometry; light polarisation; refractive index measurement; complex refractive index measurement; ellipsometry; high-resistivity silicon; liquid sample; polarization state; polarized terahertz wave; reflected wave; terahertz range; Optical amplifiers; Optical attenuators; Optical imaging; Optical polarization; Optical reflection; Optical refraction; Optical variables control;
Conference_Titel :
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-6655-9
DOI :
10.1109/ICIMW.2010.5613053
