• DocumentCode
    2720576
  • Title

    Measurement of the complex refractive index of liquids in the terahertz range using ellipsometry

  • Author

    Dobroiu, Adrian ; Otani, Chiko

  • Author_Institution
    RIKEN, Sendai, Japan
  • fYear
    2010
  • fDate
    5-10 Sept. 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    We used ellipsometry to determine the complex index of refraction of liquids in the terahertz range. The method works by allowing a polarized terahertz wave to reflect on the interface between high-resistivity silicon and the liquid sample, and analyzing the polarization state of the reflected wave.
  • Keywords
    ellipsometry; light polarisation; refractive index measurement; complex refractive index measurement; ellipsometry; high-resistivity silicon; liquid sample; polarization state; polarized terahertz wave; reflected wave; terahertz range; Optical amplifiers; Optical attenuators; Optical imaging; Optical polarization; Optical reflection; Optical refraction; Optical variables control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4244-6655-9
  • Type

    conf

  • DOI
    10.1109/ICIMW.2010.5613053
  • Filename
    5613053
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2720576