Title :
Structure and concepts for current-based analog scan
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Abstract :
This paper presents the structure of a current-based analog scan cell for analog and mixed-signal design-for-test. The cell uses current to represent the analog signal to be scanned and functions identically to a digital scan latch, except of course the scanned signal retains analog information. The concepts of scanning are explained using this structure, and some limitations, under experimental study at this time, are addressed. Techniques to apply this structure to continuous-time and sampled-data analog designs are described
Keywords :
analogue circuits; circuit testing; continuous time systems; design for testability; sampled data circuits; continuous-time design; current-based analog scan cell; design-for-test; sampled-data design; Capacitors; Circuit testing; Controllability; Design for testability; Latches; Observability; Sampling methods; Switches; Switching circuits; Voltage;
Conference_Titel :
Custom Integrated Circuits Conference, 1995., Proceedings of the IEEE 1995
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-2584-2
DOI :
10.1109/CICC.1995.518236
