On the practical implementation of mixed analog-digital BIST

Consumers are demanding more and more value for each dollar spent on new electronic equipment. Built-in Self-Test (BIST) of electronic circuits and equipment will help to satiate the demand for self test, self diagnostics, and self repair. This paper discusses some of the engineering and economical tradeoffs which must be addressed when implementing a Mixed Analog-Digital BIST (MADBIST) for an A/D converter on a mixed-signal IC. The overhead required to implement several types of tests is dealt with. The tests include frequency response, signal-to-noise ratio, gain tracking, intermodulation distortion, and harmonic distortion