On the practical implementation of mixed analog-digital BIST

Author

Toner, M.F. ; Roberts, G.W.

Author_Institution

Northern Telecom Ltd., Ottawa, Ont., Canada

fYear

1995

fDate

1-4 May 1995

Firstpage

525

Lastpage

528

Abstract

Consumers are demanding more and more value for each dollar spent on new electronic equipment. Built-in Self-Test (BIST) of electronic circuits and equipment will help to satiate the demand for self test, self diagnostics, and self repair. This paper discusses some of the engineering and economical tradeoffs which must be addressed when implementing a Mixed Analog-Digital BIST (MADBIST) for an A/D converter on a mixed-signal IC. The overhead required to implement several types of tests is dealt with. The tests include frequency response, signal-to-noise ratio, gain tracking, intermodulation distortion, and harmonic distortion

Keywords

BiCMOS integrated circuits; VLSI; analogue-digital conversion; built-in self test; electric noise measurement; frequency response; harmonic distortion; integrated circuit testing; intermodulation distortion; intermodulation measurement; mixed analogue-digital integrated circuits; A/D converter; ADC; IMD test; SNR; built-in self-test; electronic circuits; frequency response; gain tracking; harmonic distortion; intermodulation distortion; mixed analog-digital BIST; mixed-signal IC; signal-to-noise ratio; Analog integrated circuits; Analog-digital conversion; Analog-digital integrated circuits; Automatic testing; Built-in self-test; Circuit testing; Electronic circuits; Electronic equipment; Electronic equipment testing; Integrated circuit testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Custom Integrated Circuits Conference, 1995., Proceedings of the IEEE 1995

Conference_Location

Santa Clara, CA

Print_ISBN

0-7803-2584-2

Type

conf

DOI

10.1109/CICC.1995.518238

Filename

518238