Title :
Review of models for low-loss filter design and applications
Author :
Ruppel, Clemens C W ; Ruile, Werner ; Scholl, Gerd ; Wagner, Karl Ch ; Männer, O.
fDate :
Oct. 31 1994-Nov. 3 1994
Abstract :
The most frequently used models for surface acoustic wave (SAW) devices are the impulse model, the equivalent circuit models, the Coupling-of-Modes model, and the matrix models. While the impulse-model is only a first order model the other models include second order effects, e.g. reflections, dispersion, and charge distribution effects. The influence of diffraction and refraction on the transfer function of a SAW filter can be described by the angular spectrum of straight-crested waves model. A survey of these different models will be given. The simulation of low-loss filters requires flexible analysis tools, which can cope with different geometries and substrates. Operating with a parameter set, which depends only on the substrate crystal and not on the specific geometry of the SAW filter, is advantageous. Due to the high insertion attenuation of conventional transversal filters the requirements on the accuracy of the analysis are focused on S21, whereas for low-loss filters all elements of the S-matrix are important. The comparison of simulations with a P-matrix model, which fulfills the above mentioned prerequisites, and measurements of different types of low-loss filters, e.g. SPUDT, DMS, and transverse-mode coupled resonator filters are presented
Keywords :
S-matrix theory; coupled mode analysis; equivalent circuits; surface acoustic wave filters; transfer functions; ultrasonic dispersion; ultrasonic reflection; DMS; P-matrix model; S-matrix model; SAW dispersion; SAW reflections; SPUDT; angular spectrum; charge distribution effects; coupling-of-modes model; equivalent circuit models; impulse model; insertion attenuation; low-loss filter design; matrix models; second order effects; straight-crested waves model; surface acoustic wave devices; transfer function; transverse-mode coupled resonator filters; Acoustic reflection; Coupled mode analysis; Equivalent circuits; Scattering matrices; Surface acoustic wave filters; Transfer functions;
Conference_Titel :
Ultrasonics Symposium, 1994. Proceedings., 1994 IEEE
Conference_Location :
Cannes, France
Print_ISBN :
0-7803-2012-3
DOI :
10.1109/ULTSYM.1994.401602