• DocumentCode
    2721070
  • Title

    ICA-based sparse features recovery from fMRI datasets

  • Author

    Varoquaux, Gaël ; Keller, Merlin ; Poline, Jean-Baptiste ; Ciuciu, Philippe ; Thirion, Bertrand

  • Author_Institution
    Parietal Project Team, INRIA, Saclay-Île de France, France
  • fYear
    2010
  • fDate
    14-17 April 2010
  • Firstpage
    1177
  • Lastpage
    1180
  • Abstract
    Spatial Independent Components Analysis (ICA) is increasingly used in the context of functional Magnetic Resonance Imaging (fMRI) to study cognition and brain pathologies. Salient features present in some of the extracted Independent Components (ICs) can be interpreted as brain networks, but the segmentation of the corresponding regions from ICs is still ill-controlled. Here we propose a new ICA-based procedure for extraction of sparse features from fMRI datasets. Specifically, we introduce a new thresholding procedure that controls the deviation from isotropy in the ICA mixing model. Unlike current heuristics, our procedure guarantees an exact, possibly conservative, level of specificity in feature detection. We evaluate the sensitivity and specificity of the method on synthetic and fMRI data and show that it outperforms state-of-the-art approaches.
  • Keywords
    biomedical MRI; brain; cognition; diseases; feature extraction; image segmentation; independent component analysis; medical image processing; neurophysiology; sensitivity analysis; ICA; ICA mixing model; ROC; brain network; brain pathology; cognition; fMRI dataset; feature detection; functional magnetic resonance imaging; image thresholding; independent components analysis; isotropy; sensitivity; sparse feature extraction; specificity; Brain modeling; Data analysis; Gaussian processes; Independent component analysis; Neuroimaging; Principal component analysis; Signal analysis; Sparse matrices; Testing; Unsupervised learning; ICA; ROC; fMRI; sparse models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2010 IEEE International Symposium on
  • Conference_Location
    Rotterdam
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4125-9
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2010.5490204
  • Filename
    5490204