• DocumentCode
    2721097
  • Title

    Stress evolution in an encapsulated MEMS package due to viscoelasticity of packaging materials

  • Author

    Park, Seungbae ; Liu, Dapeng ; Kim, Yeonsung ; Lee, Hohyung ; Zhang, Sam

  • Author_Institution
    State Univ. of New York at Binghamton, Binghamton, NY, USA
  • fYear
    2012
  • fDate
    May 29 2012-June 1 2012
  • Firstpage
    70
  • Lastpage
    75
  • Abstract
    Packaging materials influence greatly on reliability and performance of electronics components. While, materials such as molding compound protect the package from the environment; different mechanical properties of materials will inevitably introduce stress to the package. In this study, materials´ viscoelastic effect on packaging stress in a MEMS sensor was studied using finite element analysis after measuring the properties of molding compound and die-attach materials in a series of stress relaxation experiments. The stress distribution, stress-time and stress-temperature relationship, were simulated under different final temperatures and cooling rates. It is found that viscoelasticity has significant effect on the packing stress, especially at higher temperature.
  • Keywords
    cooling; encapsulation; finite element analysis; internal stresses; micromechanical devices; moulding; packaging; viscoelasticity; cooling rates; die attach materials; electronics components; encapsulated MEMS package; finite element analysis; molding compound; packaging materials; packaging stress; stress distribution; stress evolution; stress relaxation experiments; stress temperature relationship; stress time relationship; viscoelastic effect; Compounds; Cooling; Materials; Micromechanical devices; Stress; Temperature; Temperature sensors; MEMS packaging; finite element analysis (FEA); molding compound; packaging stress; viscoelasticity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4673-1966-9
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2012.6248808
  • Filename
    6248808