DocumentCode
2721123
Title
Dynamic bending test analysis of inkjet-printed conductors on flexible substrates
Author
Halonen, Eerik ; Halme, Aki ; Karinsalo, Tapio ; Iso-Ketola, Pekka ; Mäntysalo, Matti ; Mäkinen, Riku
Author_Institution
Dept. of Electron., Tampere Univ. of Technol., Tampere, Finland
fYear
2012
fDate
May 29 2012-June 1 2012
Firstpage
80
Lastpage
85
Abstract
The need to optimize space in electronic devices has made flexible electronics an attractive option for manufacturing electronics. Techniques to fabricate flexible circuits have become more and more common and the processes increasingly more efficient. Printed electronics is a potential technique for manufacturing electronic patterns on flexible substrates. In particular, inkjet printing is an effective way to produce fine, thin, conductive structures without touching the substrate material. This study concentrated on dynamic bending analysis of inkjet-printed silver conductors on a polymer substrate. Because printed electronics is a relatively new manufacturing method, not much research is yet available on mechanical endurance of printed structures. By default, thin layers of inkjet-printed traces may just prove to have good tolerance against bending. However, factors such as adhesion between ink layer and substrate and the effect of the porous structure of sintered nanoparticle ink must be studied. This paper evaluates the capability of the inkjet technique on a flexible substrate and benchmarks the results on conventional flexible copper circuit boards. Measurements were made in real time of the resistance of conductors while bending the sample along two different radii. Results showed that printed conductors were superior in endurance over etched copper circuits.
Keywords
bending; flexible electronics; ink jet printing; polymers; printed circuit interconnections; printed circuit manufacture; printed circuit testing; silver; sintering; Ag; dynamic bending test analysis; electronic patterns; flexible electronics; flexible substrates; inkjet printed conductor; mechanical endurance; polymer substrate; porous structure; printed electronics; sintered nanoparticle ink; Conductors; Copper; Printing; Silver; Substrates; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
978-1-4673-1966-9
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2012.6248810
Filename
6248810
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