• DocumentCode
    2721153
  • Title

    IDDQ testing and defect classes-a tutorial

  • Author

    Soden, Jerry M. ; Hawkins, Charles F.

  • Author_Institution
    Dept. of Failure Anal., Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    1995
  • fDate
    1-4 May 1995
  • Firstpage
    633
  • Lastpage
    642
  • Abstract
    IDDQ testing of CMOS ICs is a technique for production quality and reliability improvement, design validation, and failure analysis. The origin and basic concepts of IDDQ testing are reviewed. The relationship of IDDQ testing to other test methods is considered in the context of the whole IC life cycle from design, fabrication, and test through end use. A comprehensive test strategy is described that uses defect classes based on defect electrical properties rather than traditional fault models
  • Keywords
    CMOS integrated circuits; electric current measurement; failure analysis; fault diagnosis; integrated circuit reliability; integrated circuit testing; leakage currents; logic testing; production testing; reviews; CMOS ICs; IDDQ testing; IC testing; defect classes; defect electrical properties; quiescent current testing; review; CMOS logic circuits; Circuit faults; Circuit testing; Fabrication; Failure analysis; Integrated circuit interconnections; Integrated circuit testing; Life testing; Production; Tutorial;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1995., Proceedings of the IEEE 1995
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    0-7803-2584-2
  • Type

    conf

  • DOI
    10.1109/CICC.1995.518262
  • Filename
    518262
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2721153