DocumentCode
2721180
Title
A CMOS embedded RF-MEMS tunable capacitor for multi-band/multi-mode smartphones
Author
Kurui, Y. ; Yamazaki, Hiroshi ; Shimooka, Y. ; Saito, Takashi ; Ogawa, Emiyu ; Ogawa, Tomomi ; Ikehashi, Tamio ; Sugizaki, Yoshiaki ; Shibata, Hajime
Author_Institution
Device Process Dev. Center, Toshiba Corp., Yokohama, Japan
fYear
2012
fDate
May 29 2012-June 1 2012
Firstpage
109
Lastpage
114
Abstract
This paper reports on 1-chip RF-MEMS tunable capacitor that equips CMOS driver circuit in the underlying layer. A Wafer Level Chip Scale Package (WLCSP) optimized for RF-MEMS is employed to minimize the module size. The MEMS actuation voltage is generated by an Actuation Voltage Generator (AVG). The boost mechanism employed in the AVG enables instant high voltage generation and reduction of the dielectric charging. The measured noise at RF frequencies is less than -120dbm, thanks to a shield metal layer formed between MEMS and CMOS layers. To achieve high power handing and high creep immunity, we employ the previously reported techniques, the Quadruple Series Capacitor (QSC) [1] and the SiN springs [2]. The quality factor measured in the WLCSP is larger than 100 at 1GHz. The capacitance can be changed from 1.4pF to 5pF by a step of 0.45pF.
Keywords
CMOS integrated circuits; Q-factor; capacitors; chip scale packaging; driver circuits; micromechanical devices; wafer level packaging; 1-chip RF-MEMS tunable capacitor; CMOS driver circuit; CMOS embedded RF-MEMS tunable capacitor; CMOS layers; MEMS actuation voltage; MEMS layers; RF frequencies; actuation voltage generator; boost mechanism; capacitance 1.4 pF to 5 pF; creep immunity; dielectric charging; frequency 1 GHz; instant high voltage generation; module size; multiband/multimode smartphones; quadruple series capacitor; quality factor; shield metal layer; wafer level chip scale package; CMOS integrated circuits; Capacitance; Capacitors; Electrodes; Micromechanical devices; Noise; Radio frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
978-1-4673-1966-9
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2012.6248814
Filename
6248814
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