• DocumentCode
    2721180
  • Title

    A CMOS embedded RF-MEMS tunable capacitor for multi-band/multi-mode smartphones

  • Author

    Kurui, Y. ; Yamazaki, Hiroshi ; Shimooka, Y. ; Saito, Takashi ; Ogawa, Emiyu ; Ogawa, Tomomi ; Ikehashi, Tamio ; Sugizaki, Yoshiaki ; Shibata, Hajime

  • Author_Institution
    Device Process Dev. Center, Toshiba Corp., Yokohama, Japan
  • fYear
    2012
  • fDate
    May 29 2012-June 1 2012
  • Firstpage
    109
  • Lastpage
    114
  • Abstract
    This paper reports on 1-chip RF-MEMS tunable capacitor that equips CMOS driver circuit in the underlying layer. A Wafer Level Chip Scale Package (WLCSP) optimized for RF-MEMS is employed to minimize the module size. The MEMS actuation voltage is generated by an Actuation Voltage Generator (AVG). The boost mechanism employed in the AVG enables instant high voltage generation and reduction of the dielectric charging. The measured noise at RF frequencies is less than -120dbm, thanks to a shield metal layer formed between MEMS and CMOS layers. To achieve high power handing and high creep immunity, we employ the previously reported techniques, the Quadruple Series Capacitor (QSC) [1] and the SiN springs [2]. The quality factor measured in the WLCSP is larger than 100 at 1GHz. The capacitance can be changed from 1.4pF to 5pF by a step of 0.45pF.
  • Keywords
    CMOS integrated circuits; Q-factor; capacitors; chip scale packaging; driver circuits; micromechanical devices; wafer level packaging; 1-chip RF-MEMS tunable capacitor; CMOS driver circuit; CMOS embedded RF-MEMS tunable capacitor; CMOS layers; MEMS actuation voltage; MEMS layers; RF frequencies; actuation voltage generator; boost mechanism; capacitance 1.4 pF to 5 pF; creep immunity; dielectric charging; frequency 1 GHz; instant high voltage generation; module size; multiband/multimode smartphones; quadruple series capacitor; quality factor; shield metal layer; wafer level chip scale package; CMOS integrated circuits; Capacitance; Capacitors; Electrodes; Micromechanical devices; Noise; Radio frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4673-1966-9
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2012.6248814
  • Filename
    6248814