DocumentCode
2721187
Title
Testability features and the testability access of the Alpha 21164 microprocessor
Author
Bhavsar, Dilip K. ; Fromm, Richard M.
Author_Institution
Digital Semicond., Digital Equipment Corp., Hudson, MA, USA
fYear
1995
fDate
1-4 May 1995
Firstpage
651
Lastpage
654
Abstract
This paper summarizes the testability features of the Alpha 21164 microprocessor chip and describes the design of the special test ports employed for accessing them
Keywords
CMOS digital integrated circuits; built-in self test; computer testing; design for testability; integrated circuit testing; logic testing; microprocessor chips; Alpha 21164 microprocessor; BIST; CMOS IC; superscalar type; test ports; testability features; Built-in self-test; Circuit faults; Circuit testing; Controllability; Frequency; Logic testing; Manufacturing; Microprocessors; Observability; Semiconductor device testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 1995., Proceedings of the IEEE 1995
Conference_Location
Santa Clara, CA
Print_ISBN
0-7803-2584-2
Type
conf
DOI
10.1109/CICC.1995.518265
Filename
518265
Link To Document