• DocumentCode
    2721237
  • Title

    A point based non-rigid registration for tumor resection using iMRI

  • Author

    Liu, Yixun ; Yao, Chengjun ; Zhou, LiangFu ; Chrisochoides, Nikos

  • Author_Institution
    Dept. of Comput. Sci., Coll. of William & Mary, Williamsburg, VA, USA
  • fYear
    2010
  • fDate
    14-17 April 2010
  • Firstpage
    1217
  • Lastpage
    1220
  • Abstract
    This paper presents a novel feature point based non-rigid registration of preoperative MRI with resected intra-operative MRI (iMRI) to compensate for brain shift during tumor resection. The registration is formulated as a three variables (Correspondence, Deformation Field and Resection Region) functional minimization problem. We solve this problem by means of a nested Expectation and Maximization (EM) framework where: (1) the inner EM loop computes the Correspondence and Deformation Field by iteratively rejecting point outliers and (2) the outer EM loop computes the Resection Region by iteratively rejecting resected elements. Our preliminary data from both synthetic and real brain MRI show the effectiveness of this method to handle tumor resection. The results of the registration in the vicinity of the tumor resection is on average, 16 times more accurate than the results from rigid registration.
  • Keywords
    biomedical MRI; brain; expectation-maximisation algorithm; image registration; medical image processing; tumours; brain shift; correspondence; deformation field; deformation resection; expectation and maximization; functional minimization; iMRI; intraoperative MRI; nonrigid registration; point outliers; resected elements; tumor resection; Boundary conditions; Computer science; Educational institutions; Finite element methods; Hospitals; Magnetic resonance imaging; Neoplasms; Neurosurgery; Surface treatment; Surgery; Biomechanical Model; Expectation and Maximization; Non-rigid registration; Outliers; Tumor Resection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2010 IEEE International Symposium on
  • Conference_Location
    Rotterdam
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4125-9
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2010.5490214
  • Filename
    5490214