• DocumentCode
    2721333
  • Title

    Optimizing the timing center for high-speed parallel buses

  • Author

    Oh, Dan ; Vaidyanath, Arun ; Madden, Chris ; Frans, Yohan ; Kim, Woopoung

  • Author_Institution
    Rambus Inc., Los Altos, CA, USA
  • fYear
    2012
  • fDate
    May 29 2012-June 1 2012
  • Firstpage
    168
  • Lastpage
    175
  • Abstract
    As data rates continue to increase, the quality of the transmitted signal is not the only important factor in the design of modern high-speed I/O interfaces; accurate positioning of the receiver clock, in order to detect an incoming signal, is also critical. Modern high-speed I/O interfaces, including both parallel and memory buses (such as Elastic Interface, QuickPath Interconnect, HyperTransport, XDR DRAM, and GDDR5 DRAM buses), already include a data-training feature used to center the receiver clock. This paper describes the general principles used in various timing centering algorithms. Specifically, two different approaches, based on the worst-case eye opening and the median of eye fuzz, are compared. The timing center can drift significantly, due to temperature variation and low frequency supply voltage noise, and consequently requires periodic updates. This paper presents an efficient way to track this timing drift periodically. In mobile applications, some of the low-power modes of operations prohibit the use of the periodic timing calibration to minimize power consumption. A novel scheme to avoid this power consumption is also introduced.
  • Keywords
    DRAM chips; clocks; high-speed integrated circuits; logic design; low-power electronics; peripheral interfaces; system buses; GDDR5 DRAM buses; HyperTransport; QuickPath interconnect; XDR DRAM; data-training feature; elastic Interface; eye fuzz; high-speed I/O interfaces; high-speed parallel buses; low-power modes; memory buses; periodic timing calibration; power consumption; receiver clock; timing center; worst-case eye opening; Accuracy; Calibration; Clocks; Jitter; Mixers; Receivers; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4673-1966-9
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2012.6248823
  • Filename
    6248823