Title :
Failsafe wafer-level packaging of a piezoelectric MEMS actuator
Author :
Matin, M.A. ; Ozaki, K. ; Akai, D. ; Sawada, K. ; Ishida, M.
Author_Institution :
Electr. & Electron. Inf. Eng., Toyohashi Univ. of Technol., Toyohashi, Japan
fDate :
May 29 2012-June 1 2012
Abstract :
Micro-electro-mechanical systems (MEMS) technology can offer a viable alternative to realize miniaturized and less expensive actuators for deformable mirror in adaptive optics for high resolution retinal imaging. However, during fabrication of such devices, functional multilayered thin films are generally deposited at elevated temperatures. These films are therefore subjected to residual stresses which may result in bending of the structure. The bending thus occurred may lead to failure at interfaces between films. A successful fabrication of device therefore relies on the engineering justification of multi-structured device design and growth parameters used in fabrication. In this paper, we present the design of a piezoelectric (ceramic) thin film based MEMS actuator for deformable mirror used in retinal imaging. A proto-type piezoelectric thin film actuator has been fabricated epitaxially using Pt/PZT/SRO/Pt/γ-Al2O3/Si structure. Advanced 3D finite element simulations were conducted to correlate the bending of fabricated structure with residual stresses. A smart alternative design was also proposed employing an extra layer of aluminium in the diaphragm region. Simulation results predict a failsafe structure when the thickness of extra Al-layer is tailored to an optimal thickness. The outcome of this research can be used to overcome the challenge encountered (bending due to residual stresses) to obtain a failsafe wafer-level packaged MEMS actuator for deformable mirror.
Keywords :
adaptive optics; aluminium compounds; ceramics; finite element analysis; internal stresses; lead compounds; microactuators; micromirrors; piezoelectric actuators; piezoelectric thin films; platinum; silicon; wafer level packaging; 3D finite element simulations; Pt-PZT-Pt-Al2O3-Si; adaptive optics; ceramics; deformable mirror; failsafe wafer-level packaging; functional multilayered thin films; high resolution retinal imaging; microelectromechanical systems; piezoelectric MEMS actuator; piezoelectric thin film actuator; residual stresses; Actuators; Adaptive optics; Films; Micromechanical devices; Retina; Stress; Substrates;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-1966-9
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2012.6248855