DocumentCode
2721910
Title
The effect of doping and grain size on electrostriction in PbZr0.52TiO0.48O3
Author
Sundar, V. ; Kim, N. ; Randall, CA ; Yimnirun, R. ; Newnham, R.E.
Author_Institution
Mater. Res. Lab., Pennsylvania State Univ., University Park, PA, USA
Volume
2
fYear
1996
fDate
18-21 Aug 1996
Firstpage
935
Abstract
The electromechanical properties of undoped PbZr0.52Ti 0.48O3 (PZT 52/48) samples in a size range 0.7-14 μ were studied as a function of the grain size. Internal bias fields were found to have significant effects on the dielectric and piezoelectric behavior samples. Strains from domain reorientation caused hysteresis in the strain vs. polarization curves. It was necessary to filter out these contributions in order to study the variation in Q33, the average ceramic electrostriction coefficient, with grain size. Q33 varied from 2.44m4/C2 at 14 μ to 2.04 m4/C2 at 0.7 μ. An apparent critical size of 2.4 μ was observed for Q33. The suppression of the maximum dielectric constant for PZT 52/48 at the Curie Temperature may be related to the changes in grain size through the electrostrictive effects of clamping stresses
Keywords
electrostriction; grain size; lead compounds; piezoceramics; Curie temperature; PZT; PbZr0.52TiO0.48O3; PbZrO3TiO3; ceramic; clamping stress; dielectric constant; dielectric properties; domain reorientation; doping; electromechanical properties; electrostriction coefficient; grain size; hysteresis; internal bias field; piezoelectric properties; strain polarization characteristics; Capacitive sensors; Ceramics; Dielectric constant; Doping; Electrostriction; Filters; Grain size; Hysteresis; Piezoelectric polarization; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 1996. ISAF '96., Proceedings of the Tenth IEEE International Symposium on
Conference_Location
East Brunswick, NJ
Print_ISBN
0-7803-3355-1
Type
conf
DOI
10.1109/ISAF.1996.598180
Filename
598180
Link To Document