• DocumentCode
    2721958
  • Title

    Novel interconnect materials for high reliability power converters with operation temperatures above 150°C

  • Author

    Duch, Susanne ; Krebs, Thomas ; Loewer, Y. ; Schmitt, Wagner ; Thomas, Martyn

  • Author_Institution
    Contact Mater. Div., Heraeus Mater. Technol. GmbH & Co. KG, Hanau, Germany
  • fYear
    2012
  • fDate
    May 29 2012-June 1 2012
  • Firstpage
    416
  • Lastpage
    422
  • Abstract
    Power semiconductor modules are used in a wide field of applications and power ranges. Two common trends for these devices are miniaturization and cost reduction, leading to new requirements for dies, substrates and interconnect materials. As a result, the power density and therefore the operation temperature in the devices rise, creating the need for new interconnect materials. These materials must have high thermal and electrical conductivity to ensure excellent heat dissipation and thermo-mechanical stability. Consequently, the device operation temperature, which is currently limited to maximum 150°C, can be increased and the reliability of the module can be improved. The novel mAgic sinter materials feature highest thermal and electrical conductivity and can be used for operation temperatures above 150°C. This new material family provides a solution to reduce size and cost of high power semiconductor modules and, at the same time, improves the overall performance and reliability of these packages.
  • Keywords
    integrated circuit interconnections; power convertors; power semiconductor devices; semiconductor device reliability; cost reduction; electrical conductivity; high power semiconductor modules; high reliability power converters; interconnect materials; mAgic sinter materials; miniaturization reduction; operation temperature; power density; temperature 150 degC; thermal conductivity; thermo-mechanical stability; Heating; Joints; Microassembly; Silver; Soldering; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4673-1966-9
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2012.6248864
  • Filename
    6248864