DocumentCode
2722054
Title
Wide Angle Impedance Matching techniques for volumetrically scanned phased arrays
Author
Sikina, Thomas V.
Author_Institution
Integrated Defense Syst. Integrated Defense Syst., Raytheon Co., Sudbury, MA, USA
fYear
2010
fDate
12-15 Oct. 2010
Firstpage
924
Lastpage
929
Abstract
The scan and frequency dependent aperture surface impedance is a useful way to study the effects of the active phased array. The surface impedance of an ideal current sheet diverges for orthogonal E- and H-plane polarizations at large scan angles, based on fundamentals. This phenomenon can be reproduced in the phased array unit cell using modern Finite Element Modeling techniques. It can also be corrected within a limited frequency range using complex conjugate matching schemes, which are also termed Wide Angle Impedance Matching (WAIM) techniques. While these latter techniques often introduce surface wave resonance effects, a parasitic element approach satisfies the complex conjugate condition with minimal surface wave effects. This last approach includes the geometry found in a stacked patch radiator.
Keywords
antenna phased arrays; electromagnetic wave polarisation; finite element analysis; geometry; impedance matching; complex conjugate matching schemes; finite element modeling techniques; frequency dependent aperture surface impedance; orthogonal E-plane polarizations; orthogonal H-plane polarizations; phased array unit cell; scan dependent aperture surface impedance; stacked patch radiator; volumetrically scanned phased arrays; wide angle impedance matching techniques; Apertures; Bandwidth; Dielectrics; Impedance; Phased arrays; Surface impedance; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Phased Array Systems and Technology (ARRAY), 2010 IEEE International Symposium on
Conference_Location
Waltham, MA
Print_ISBN
978-1-4244-5127-2
Electronic_ISBN
978-1-4244-5128-9
Type
conf
DOI
10.1109/ARRAY.2010.5613252
Filename
5613252
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