Beyond Scaling - Realizing Value Through the Integration of Memory and Autonomic Chip Features

As we scale to 45nm and beyond, the expectations of increased functional value per unit cost may only be met with a more holistic technology integration based on systems needs. We consider two approaches: leveraging embedded dense memory. We examine the scalability and performance issues of embedded memory and the autonomic chip - where a judicious use of circuit innovation, material and physical phenomena are employed to yield self diagnosing and self healing and perhaps even self reconfiguring chips extending both the lifetime and scope of the chip