Title :
Cardiac left atrium CT image segmentation for ablation guidance
Author :
Koppert, M.M.J. ; Rongen, P.M.J. ; Prokop, M. ; ter Haar Romeny, B.M. ; van Assen, H.C.
Author_Institution :
Dept. of Biomed. Eng., Eindhoven Univ. of Technol., Eindhoven, Netherlands
Abstract :
Catheter ablation is an increasingly important curative procedure for atrial fibrillation. Knowledge of the local wall thickness is essential to determine the proper ablation energy. This paper presents the first semi-automatic atrial wall thickness measurement method for ablation guidance. It includes both endocardial and epicardial atrial wall segmentation on CT image data. Segmentation is based on active contours, Otsu´s multiple threshold method and hysteresis thresholding. Segmentation results were compared to contours manually drawn by two experts, using repeated measures analysis of variance. The root mean square differences between the semi-automatic and the manually drawn contours were comparable to intra-observer variation (endocardium: p = 0.23, epicardium: p = 0.18). Mean wall thickness difference is significant between one of the experts on one side, and the presented method and the other expert on the other side (p <; 0.001). Wall thicknesses found were in the range of 0.5-5.5mm, corresponding to values presented in literature.
Keywords :
biomedical measurement; blood vessels; cardiovascular system; catheters; computerised tomography; diseases; image segmentation; medical image processing; muscle; CT image segmentation; Otsu multiple threshold method; ablation energy; ablation guidance; atrial fibrillation; atrial wall thickness; cardiac left atrium; catheter ablation; endocardial atrial wall; epicardial atrial wall; hysteresis thresholding; Active contours; Atrial fibrillation; Biomedical engineering; Biomedical imaging; Blood; Catheters; Computed tomography; Image segmentation; Medical services; Myocardium; CT; Cardiac Left Atrium; Catheter Ablation; Medical Image Analysis; Segmentation;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2010 IEEE International Symposium on
Conference_Location :
Rotterdam
Print_ISBN :
978-1-4244-4125-9
Electronic_ISBN :
1945-7928
DOI :
10.1109/ISBI.2010.5490304