DocumentCode :
2722641
Title :
Effects of on-chip decoupling capacitors and silicon substrate on power distribution networks in TSV-based 3D-ICs
Author :
Kim, Kiyeong ; Pak, Jun So ; Lee, Hyungdong ; Kim, Joungho
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
fYear :
2012
fDate :
May 29 2012-June 1 2012
Firstpage :
690
Lastpage :
697
Abstract :
To analyze the effects of the on-chip decoupling capacitors (on-chip decaps) and silicon substrate on three-dimensional (3D) stacked on-chip power distribution networks (PDNs) in through silicon via (TSV)-based 3D-ICs, we propose a model for 3D stacked on-chip PDNs that includes the effects of the on-chip decaps and silicon substrate. The model is the RLGC-lumped model based on the segmentation method and scalable equations derived from physical configurations. The model is successfully validated by the 3D EM simulation using CST MWS up to 20 GHz. Using the proposed model, we analyze the effects of the on-chip decaps and silicon substrate on the impedance of 3D stacked on-chip PDNs with respect to variations in the capacitance and position of on-chip decaps, the conductivity of the silicon substrate, and the height between the on-chip PDN and silicon substrate.
Keywords :
capacitors; elemental semiconductors; integrated circuit modelling; microwave integrated circuits; silicon; three-dimensional integrated circuits; 3D EM simulation; 3D stacked on-chip PDN; CST MWS; RLGC-lumped model; Si; TSV-based 3D-IC; on-chip decaps; on-chip decoupling capacitor effects; physical configurations; segmentation method; silicon substrate; three-dimensional stacked on-chip power distribution networks; through silicon via-based integrated circuit; Capacitance; Impedance; Mathematical model; Silicon; Solid modeling; Substrates; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4673-1966-9
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2012.6248907
Filename :
6248907
Link To Document :
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