DocumentCode
2722660
Title
Test features of the MC145472 ISDN U-transceivers
Author
Bonet, L. ; Ganger, J. ; Girardeau, J. ; Greaves, C. ; Pendleton, M. ; Yatim, D.
Author_Institution
Motorola Inc., Austin, TX, USA
fYear
1990
fDate
10-14 Sep 1990
Firstpage
68
Lastpage
79
Abstract
The design of a single-chip implementation of a 2B1Q ISDN (integrated services digital network) U transceiver that meets the ANSI T1.601 standards has been completed. The MC145472 was designed with testability in mind and to be consistent with Motorola´s design-for-manufacturability goals. The authors describe in detail the design-for-testability techniques specifically intended for the IC manufacturer production test and other ad hoc test/diagnostic structures for the customer to use in evaluating system performance. A global test strategy for testing the ISDN U transceiver is presented. The test features have been used extensively not only for testing the device in the production environment but also for conducting evaluations and design verification experiments during the chip debugging phase. The test features described are well integrated with the architecture of the chip, thus minimizing incremental cost
Keywords
ISDN; automatic testing; electronic equipment testing; production testing; transceivers; 2B1Q ISDN; IC manufacturer production test; MC145472 ISDN U-transceivers; Motorola; chip debugging; cost; design verification; design-for-manufacturability; design-for-testability; integrated services digital network; ANSI standards; Costs; Debugging; ISDN; Integrated circuit testing; Manufacturing; Production systems; System performance; System testing; Transceivers;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1990. Proceedings., International
Conference_Location
Washington, DC
Print_ISBN
0-8186-9064-X
Type
conf
DOI
10.1109/TEST.1990.114002
Filename
114002
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