Testability implemented in the VAX 6000 model 400

Author

Sweeney, John

Author_Institution

Digital Equipment Corp., Andover, MA, USA

fYear

1990

fDate

10-14 Sep 1990

Firstpage

109

Lastpage

114

Abstract

The author describes two test features in the VAX 6000 model 400 processor which help test and diagnose the module in a manufacturing environment. The continuity transistor structure allows an in-circuit tester to detect and diagnose open faults between the chips and the board using analog instrumentation. The observe boundary scan feature is designed to help detect and diagnose faults during full-speed system test. The overhead caused by both of these test features is negligible in terms of additional silicon area, device pins, and signal delay. The test features combined with a well-controlled assembly process and a very robust design have allowed the VAX 6000 model 400 processor to be manufactured economically

Keywords

DEC computers; automatic testing; computer testing; electronic equipment testing; fault location; logic testing; microprocessor chips; modules; printed circuit testing; production testing; DEC; Si; VAX 6000 model 400; automatic testing; boundary scan; computer testing; continuity transistor structure; device pins; in-circuit tester; manufacturing environment; open faults; production testing; signal delay; Assembly; Delay; Fault detection; Instruments; Manufacturing processes; Pins; Robustness; Silicon; System testing; Virtual manufacturing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1990. Proceedings., International

Conference_Location

Washington, DC

Print_ISBN

0-8186-9064-X

Type

conf

DOI

10.1109/TEST.1990.114007

Filename

114007