• DocumentCode
    2722807
  • Title

    Mixed-mode ATPG under input constraints

  • Author

    Glover, C. Thomas

  • Author_Institution
    Motorola Inc., Austin, TX, USA
  • fYear
    1990
  • fDate
    10-14 Sep 1990
  • Firstpage
    142
  • Lastpage
    151
  • Abstract
    A pragmatic method of mixed-mode automatic test pattern generation (ATPG) which can operate under constrained inputs is presented. The author discusses fundamental modifications to traditional ATPG which allow tests to be generated for nontrivial circuits containing switch-level primitives. The program used, SPHINX, achieves reasonable fault coverages for mixed-mode circuits larger than those previously reported
  • Keywords
    application specific integrated circuits; automatic testing; fault location; integrated circuit testing; logic testing; ASIC; IC testing; SPHINX; constrained inputs; fault coverages; input constraints; logic testing; mixed-mode automatic test pattern generation; switch-level primitives; Algebra; Automatic test pattern generation; Circuit faults; Circuit testing; Clocks; Feeds; Logic testing; Switches; Switching circuits; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1990. Proceedings., International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-8186-9064-X
  • Type

    conf

  • DOI
    10.1109/TEST.1990.114012
  • Filename
    114012
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2722807