Title :
Mixed-mode ATPG under input constraints
Author :
Glover, C. Thomas
Author_Institution :
Motorola Inc., Austin, TX, USA
Abstract :
A pragmatic method of mixed-mode automatic test pattern generation (ATPG) which can operate under constrained inputs is presented. The author discusses fundamental modifications to traditional ATPG which allow tests to be generated for nontrivial circuits containing switch-level primitives. The program used, SPHINX, achieves reasonable fault coverages for mixed-mode circuits larger than those previously reported
Keywords :
application specific integrated circuits; automatic testing; fault location; integrated circuit testing; logic testing; ASIC; IC testing; SPHINX; constrained inputs; fault coverages; input constraints; logic testing; mixed-mode automatic test pattern generation; switch-level primitives; Algebra; Automatic test pattern generation; Circuit faults; Circuit testing; Clocks; Feeds; Logic testing; Switches; Switching circuits; System testing;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114012
