Title :
Why, IDDQ? [CMOS IC testing]
Author_Institution :
Ford Microelectron. Inc., Colorado Springs, CO, USA
Abstract :
Summary form only given. The author discusses the research conducted by Ford Microelectronics on the impact that IDDQ testing will have on the automotive IC industry. This research has been directed toward developing the tools to implement IDDQ testing, to identify failure locations, to understand what IDDQ identifies, to assess vendor quality levels, and to gauge the reliability impact. The increased sensitivity to processing problems that IDDQ testing provides makes it possible to detect infant mortality and early life failures before they become functionally bad. This has been substantiated through lower burn-in failures and life test studies
Keywords :
CMOS integrated circuits; automotive electronics; fault location; integrated circuit testing; quality control; reliability; CMOS IC; Ford Microelectronics; IDDQ testing; QC; automotive IC industry; failure locations; reliability; sensitivity; CMOS integrated circuits; CMOS technology; Integrated circuit testing;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114024
