DocumentCode
2722998
Title
I DDQ testing because `zero defects isn´t enough´: a Philips perspective
Author
Baker, Keith ; Verhelst, Bas
Author_Institution
Philips Res. Lab., Eindhoven, Netherlands
fYear
1990
fDate
10-14 Sep 1990
Firstpage
253
Lastpage
254
Abstract
The application of I DDQ testing to CMOS devices at Philips is discussed. Philips´ major IC lab facilities in Europe and the United States have a long history of using I DDQ in production testing of high-volume CMOS SSI and MSI. The internally developed Philips digital component ATE (automatic test equipment), the LOCMOS tester, had the unique feature of an I DDQ capability of better than 1 μA on all channels. The need for a fast and sensitive I DDQ monitor is pointed out. An examination of the future of I DDQ from a device quality viewpoint indicates that the really critical issues for research into I DDQ are related to stress and accelerated life testing
Keywords
CMOS integrated circuits; electric current measurement; integrated circuit testing; life testing; production testing; ATE; CMOS devices; IDDQ; IC testing; LOCMOS tester; MSI; Philips; SSI; accelerated life testing; monitor; production testing; stress; Automatic test equipment; Automatic testing; CMOS integrated circuits; Europe; History; Integrated circuit testing; Life estimation; Monitoring; Production; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1990. Proceedings., International
Conference_Location
Washington, DC
Print_ISBN
0-8186-9064-X
Type
conf
DOI
10.1109/TEST.1990.114025
Filename
114025
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