• DocumentCode
    2723005
  • Title

    Including Power Supply Variations into Static Timing Analysis: Methodology and Flow

  • Author

    Graziano, Mariagrazia ; Forzan, Cristiano ; Pandini, Davide

  • Author_Institution
    Dipt. di Elettronica, Politecnico di Torino
  • fYear
    2005
  • fDate
    19-23 Sept. 2005
  • Firstpage
    229
  • Lastpage
    232
  • Abstract
    In deep sub-micron technologies post-layout tuning analysis has become the most critical phase in the verification of large system-on-chip (SoC) designs with several power-hungry blocks. An increasingly important factor that can introduce a severe performance loss is the power supply noise. As technology advances into the nanometer regime, the operating frequencies increase, and clock gating has emerged as an effective technique to limit the power consumption in block-based designs. As a consequence, the amplitude of the supply voltage fluctuations has reached values where techniques to include the effect of power supply noise into timing analysis based on linear models are no longer adequate, and the non-linear dependence of cell delay from supply voltage must be considered. In this work we present a practical methodology that accurately takes into account the power supply noise effects in static timing analysis, which can be seamlessly included into an industrial sign-off design flow. The experimental results obtained from the timing verification of an industrial SoC design have demonstrated the effectiveness of our approach
  • Keywords
    data flow analysis; formal verification; integrated circuit design; noise; power supply quality; system-on-chip; timing; block-based designs; clock gating; deep sub-micron technology; industrial SoC design; post-layout tuning analysis; power supply noise; power supply variations; sign-off design flow; static timing analysis; supply voltage fluctuations; Clocks; Electricity supply industry; Energy consumption; Frequency; Performance loss; Power supplies; System-on-a-chip; Timing; Tuning; Voltage fluctuations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOC Conference, 2005. Proceedings. IEEE International
  • Conference_Location
    Herndon, VA
  • Print_ISBN
    0-7803-9264-7
  • Type

    conf

  • DOI
    10.1109/SOCC.2005.1554500
  • Filename
    1554500