Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
Summary form only given. It is pointed out that current testing is and will increasingly become attractive as a main technique for testing static CMOS circuits. BIC (built-in current) testing can provide testing qualities achievable with other testing techniques. It is suggested that future testing approaches geared toward high-quality and/or reliability-oriented testing procedures will be formed using a combination of voltage and current testing methodologies
Keywords :
CMOS integrated circuits; electric current measurement; fault location; integrated circuit testing; production testing; IC testing; VLSI; built-in current testing; reliability; static CMOS circuits; voltage testing; CMOS technology; Capacitance; Circuit faults; Circuit testing; Computerized monitoring; Condition monitoring; Integrated circuit testing; Microelectronics; Very large scale integration; Voltage;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114027
