Title :
Obstacles and an approach towards concurrent engineering
Author :
Breuer, Melvin A.
Author_Institution :
Dept. of Electr. Eng.-Syst., Univ. of Southern California, Los Angeles, CA, USA
Abstract :
The integration of design-for-testability (DFT) and built-in self-test (BIST) into early stages of the overall design process is examined. Obstacles to concurrent engineering (CE) are briefly examined; they include short-sighted view of management, the ignoring of life-cycle costs by design management and contractors, area/functionality/performance myths, the view of testing as someone else´s problem, lack of knowledge by design engineers, and lack of tools for supporting DFT and BIST. An approach toward CE is illustrated, with the focus on the example of the ADAM; (Advanced Design AutoMation) system. Specifically, ADAM includes the TEST system, a knowledge-based system that incorporates DFT and BIST considerations into the early stage of the design cycle of a product. It is believed that, with the cooperation of management, the proper set of CAD (computer-aided-design) tools, and designer training CE can become a reality
Keywords :
automatic testing; circuit CAD; circuit layout CAD; knowledge based systems; ADAM; ASIC; BIST; CAD; PCB; built-in self-test; concurrent engineering; design-for-testability; knowledge-based system; life-cycle costs; Built-in self-test; Concurrent engineering; Cost function; Design automation; Design for testability; Engineering management; Knowledge management; Life testing; Management training; Process design;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114029