• DocumentCode
    2723080
  • Title

    Multi-modal non-rigid image registration based on similarity and dissimilarity with the prior joint intensity distributions

  • Author

    So, Ronald W K ; Chung, Albert C S

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
  • fYear
    2010
  • fDate
    14-17 April 2010
  • Firstpage
    368
  • Lastpage
    371
  • Abstract
    Multi-modal non-rigid image registration is widely used in different areas, including medical image analysis and image processing. In this paper, we introduce a new learning-based method for non-rigid image registration. The proposed method is based on a priori knowledge of the joint intensity distribution of a pre-aligned image pair. The similarity and dissimilarity of the expected and observed joint intensity distributions are measured by two Kullback-Leibler distances (KLD). Free-Form Deformation (FFD) is employed as the transformation model along with the L-BFGS-B optimizer. The derivatives of KLDs are derived to work with the L-BFGS-B optimizer. Moreover, we have tested our method with CT-T1 image pairs and compared the results obtained by using the mutual information based FFD and the conventional KLD based FFD. The experimental results show that our method gives remarkable improvement on the registration quality.
  • Keywords
    biomedical MRI; computerised tomography; deformation; image registration; medical image processing; CT; Kullback-Leibler distances; L-BFGS-B optimizer; MRI; a priori knowledge; dissimilarity; free-form deformation; multi-modal nonrigid image registration; prior joint intensity distributions; similarity; transformation model; Biomedical engineering; Biomedical imaging; Computer science; Deformable models; Image analysis; Image processing; Image registration; Mutual information; Robustness; Testing; Kullback-Leibler distances; Non-rigid image registration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2010 IEEE International Symposium on
  • Conference_Location
    Rotterdam
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4125-9
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2010.5490332
  • Filename
    5490332