Title :
Efficient UBIST implementation for microprocessor sequencing parts
Author_Institution :
IMAG/TIM3, Grenoble, France
Abstract :
An improved self-checking solution for the sequencing part of the MC 68000 microprocessor is presented. Compared with previous self-checking schemes for this microprocessor, the present scheme makes its possible to reduce the overhead and simplifies the implementation of both functional circuits, and checkers. The unified BIST (built-in self-test) method is applied to this scheme. This method uses a merging of self-checking and BIST techniques and allows a high fault coverage for all tests needed for integrated circuits, e.g., offline test (design verification, manufacturing, and maintenance test) and online concurrent error detection. An area overhead of about 27% is required, which is quite satisfactory in comparison with previous results
Keywords :
automatic testing; built-in self test; computer testing; integrated circuit testing; logic testing; maintenance engineering; microprocessor chips; production testing; sequential circuits; MC 68000 microprocessor; area overhead; design verification; fault coverage; functional circuits; integrated circuits; logic testing; maintenance test; mentation for microprocessor sequencing; offline test; online concurrent error detection; production testing; self-checking; unified BIST; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Integrated circuit manufacture; Integrated circuit testing; Merging; Microprocessors;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114038
