Title :
Large-area dielectric breakdown performance of polymer films - part i: measurement method evaluation and statistical considerations on area-dependence
Author :
Rytöluoto, I. ; Lahti, K. ; Karttunen, M. ; Koponen, M.
Author_Institution :
Dept. of Electr. Eng., Tampere Univ. of Technol., Tampere, Finland
Abstract :
A multi-breakdown measurement method for large-area dielectric breakdown characterization of polymer films is presented and evaluated. Based on the self-healing breakdown capability of metalized film, large amount of breakdown data can be obtained from a relatively large total film area, thus enabling the execution of detailed breakdown performance analysis. The studied films include non-metalized laboratory-scale, pilot-scale and commercial capacitor-grade bi-axially oriented polypropylene films in the thickness range of 14-25 μm. With the active measurement area of 81 cm2 per sample, breakdown distributions covering total film areas of 486-972 cm2 are presented. Various aspects encompassing the sample film preparation, measurement procedure, breakdown progression, discharge event characterization, breakdown field determination, data validation and statistical analysis are discussed. Comparative small-area breakdown measurements were performed in order to study the relationship between the large-area multi-breakdown measurement method and a conventional small-area (1 cm2) manual breakdown measurement method. Implications of the area-dependence and the applicability of the Weibull area-scaling are also discussed.
Keywords :
Weibull distribution; capacitors; dielectric thin films; discharges (electric); polymer films; Weibull area scaling; biaxially oriented polypropylene film; breakdown field determination; breakdown progression; capacitor grade polypropylene film; data validation; discharge event characterization; film preparation; large area dielectric breakdown; measurement procedure; multibreakdown measurement method; polymer films; self-healing breakdown; size 14 mum to 25 mum; statistical analysis; Breakdown voltage; Current measurement; Discharges (electric); Films; Laboratories; Voltage measurement; Dielectric breakdown; Weibull distribution; area-dependence; large-area breakdown performance; self-healing; statistical analysis;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2015.7076764